James Alexander Liddle - Citas de Google Académico

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Coautores

Reginald C. FarrowNew Jersey Institute of TechnologyDirección de correo verificada de njit.edu
Jeffrey Bokor Professor of electrical engineering and computer sciences, University of California, BerkeleyDirección de correo verificada de eecs.berkeley.edu
Patrick NaulleauLawrence Berkeley National LabDirección de correo verificada de lbl.gov
Carmen S. MenoniUniversity Distinguished Professor, Electrical & Computer Engineering, Colorado State UniversityDirección de correo verificada de colostate.edu
Arun PersaudLawrence Berkeley National LaboratoryDirección de correo verificada de lbl.gov
Thomas SchenkelLawrence Berkley National LaboratoryDirección de correo verificada de lbl.gov
Chris GrovenorProfessor of Materials, Oxford UniversityDirección de correo verificada de materials.ox.ac.uk
Kenneth A. GoldbergOptical Physicist, Lawrence Berkeley National Laboratory; Advanced Light Source (ALS) & ALS-UDirección de correo verificada de lbl.gov
Samuel M. StavisNational Institute of Standards and Technology (NIST)Dirección de correo verificada de nist.gov
Christian J. LongNational Institute of Standards and TechnologyDirección de correo verificada de nist.gov
Thomas F. LamPhysical Scientist, Smithsonian Museum Conservation InstituteDirección de correo verificada de si.edu
Ivo Rangelow Prof. Dr.Technische Universität IlmenauDirección de correo verificada de tu-ilmenau.de
Miguel LarotondaQuantum Optics Laboratory CEILAP (CITEDEF CONICET)Dirección de correo verificada de citedef.gob.ar
Sunghoon KwonSeoul National University, Department of Electrical and Computer EngineeringDirección de correo verificada de snu.ac.kr
R. Stanley WilliamsTexas A & M University ECE DepartmentDirección de correo verificada de rstanleywilliams.com
Shih-Yuan (SY) WangWWSensDevices, Inc., HP Labs, UC Berkeley, Agilent, GazillionbitsDirección de correo verificada de ieee.org
Jabez McclellandNISTDirección de correo verificada de nist.gov
Greg DenbeauxSUNY Polytechnic Institute, College of Nanoscale Science and EngineeringDirección de correo verificada de sunypoly.edu
Seong-Ju ParkGwangju Institute of Science and Technology, KoreaDirección de correo verificada de gist.ac.kr
Nathan OrloffNational Institute of Standards and Technology, BoulderDirección de correo verificada de nist.gov

James Alexander Liddle

Scientific Director, Microsystems and Nanotechnology Division, NIST

Dirección de correo verificada de nist.gov

Nanofabrication self-assembly directed self-assembly nanomanufacturing


Título	Citado por	Año
Soft X-ray microscopy at a spatial resolution better than 15 nm W Chao, BD Harteneck, JA Liddle, EH Anderson, DT Attwood Nature 435 (7046), 1210, 2005	970	2005
Integration of colloidal nanocrystals into lithographically patterned devices Y Cui, MT Björk, JA Liddle, C Sönnichsen, B Boussert, AP Alivisatos Nano Letters 4 (6), 1093-1098, 2004	605	2004
Vacuum compatible fluid sampler JA Liddle, SM Stavis, GE Holland US Patent 10,265,699, 2019	196	2019
Low-cost, low-loss microlens arrays fabricated by soft-lithography replication process MV Kunnavakkam, FM Houlihan, M Schlax, JA Liddle, P Kolodner, ... Applied physics letters 82 (8), 1152-1154, 2003	178	2003
One-kilobit cross-bar molecular memory circuits at 30-nm half-pitch fabricated by nanoimprint lithography W Wu, GY Jung, DL Olynick, J Straznicky, Z Li, X Li, DAA Ohlberg, Y Chen, ... Applied Physics A 80 (6), 1173-1178, 2005	167	2005
Absorption and luminescence studies of free-standing porous silicon films YH Xie, MS Hybertsen, WL Wilson, SA Ipri, GE Carver, WL Brown, E Dons, ... Physical Review B 49 (8), 5386, 1994	149	1994
Vacuum ultraviolet rare gas excimer light source J Wieser, DE Murnick, A Ulrich, HA Huggins, A Liddle, WL Brown Review of Scientific Instruments 68 (3), 1360-1364, 1997	147	1997
Sub-38 nm resolution tabletop microscopy with 13 nm wavelength laser light G Vaschenko, C Brewer, F Brizuela, Y Wang, MA Larotonda, BM Luther, ... Optics Letters 31 (9), 1214-1216, 2006	138	2006
Projection electron‐beam lithography: A new approach SD Berger, JM Gibson, RM Camarda, RC Farrow, HA Huggins, JS Kraus, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1991	124	1991
Solid state quantum computer development in silicon with single ion implantation T Schenkel, A Persaud, SJ Park, J Nilsson, J Bokor, JA Liddle, R Keller, ... Journal of Applied Physics 94 (11), 7017-7024, 2003	122	2003
Soft X-ray microscopy of nanomagnetism P Fischer, DH Kim, W Chao, JA Liddle, EH Anderson, DT Attwood Materials Today 9 (1-2), 26-33, 2006	117	2006
Lithographically directed self-assembly of nanostructures JA Liddle, Y Cui, P Alivisatos Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2004	116	2004
Status of EUV micro-exposure capabilities at the ALS using the 0.3-NA MET optic P Naulleau, KA Goldberg, EH Anderson, K Bradley, R Delano, P Denham, ... Emerging Lithographic Technologies VIII 5374, 881-891, 2004	108	2004
FinFET SONOS flash memory for embedded applications P Xuan, M She, B Harteneck, A Liddle, J Bokor, TJ King IEEE International Electron Devices Meeting 2003, 26.4. 1-26.4. 4, 2003	102	2003
Electrical activation and electron spin coherence of ultralow dose antimony implants in silicon T Schenkel, JA Liddle, A Persaud, AM Tyryshkin, SA Lyon, R De Sousa, ... Applied Physics Letters 88 (11), 112101, 2006	96	2006
Magneto-optical observation of picosecond dynamics of single nanomagnets A Barman, S Wang, JD Maas, AR Hawkins, S Kwon, A Liddle, J Bokor, ... Nano letters 6 (12), 2939-2944, 2006	94	2006
Tuning magnetic domain structure in nanoscale La0. 7Sr0. 3MnO3 islands Y Takamura, RV Chopdekar, A Scholl, A Doran, JA Liddle, B Harteneck, ... Nano letters 6 (6), 1287-1291, 2006	92	2006
Nanoimaging with a compact extreme-ultraviolet laser G Vaschenko, F Brizuela, C Brewer, M Grisham, H Mancini, CS Menoni, ... Optics letters 30 (16), 2095-2097, 2005	91	2005
Methods to assess the impact of UV irradiation on the surface chemistry and structure of multiwall carbon nanotube epoxy nanocomposites EJ Petersen, T Lam, JM Gorham, KC Scott, CJ Long, D Stanley, R Sharma, ... Carbon 69, 194-205, 2014	87	2014
Implementation of an imprint damascene process for interconnect fabrication GM Schmid, MD Stewart, J Wetzel, F Palmieri, J Hao, Y Nishimura, K Jen, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2006	85	2006

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