Jean-François PIERSON - Citas de Google Académico

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david horwatFull Professor, Institut Jean Lamour, Université de LorraineDirección de correo verificada de univ-lorraine.fr
alain billardProfesseur des Universités, UTBMDirección de correo verificada de utbm.fr
Dr. CAPON FabienUniversity of Lorraine, Institut Jean LamourDirección de correo verificada de univ-lorraine.fr
Frank MücklichProfessor für Funktionswerkstoffe, Universität des Saarlandes, Director Material Engineering Center Saarland, Editor Practical MetallographyDirección de correo verificada de matsci.uni-sb.de
Jaafar GhanbajaInstitut Jean LamourDirección de correo verificada de univ-lorraine.fr
Yong WangNIMSDirección de correo verificada de nims.go.jp
Nicolas MARTINFull Professor, FEMTO-ST Institute, ENSMM Besançon, Université Bourgogne Franche-ComtéDirección de correo verificada de femto-st.fr
Thierry BrousseProfesseur, Université de Nantes, University of Nantes, Polytech, IMN UMR CNRS 6502, Institut desDirección de correo verificada de univ-nantes.fr
Thierry BELMONTEResearcherDirección de correo verificada de univ-lorraine.fr
Filipe VazUniversidade do Minho, PortugalDirección de correo verificada de fisica.uminho.pt
Philippe SteyerMateis laboratory, INSA de LyonDirección de correo verificada de insa-lyon.fr
Flavio SolderaSaarland UniversityDirección de correo verificada de matsci.uni-sb.de
Albano CavaleiroProfessor de Engenharia Mecânica, University of CoimbraDirección de correo verificada de dem.uc.pt
Luís CunhaAssistant Professor - Centre of Physics - University of MinhoDirección de correo verificada de fisica.uminho.pt
Stéphanie BruyereInstitut Jean Lamour - Université de LorraineDirección de correo verificada de univ-lorraine.fr
Philippe GoudeauCNRSDirección de correo verificada de univ-poitiers.fr
Patrick LaffezUniversity of Tours FranceDirección de correo verificada de univ-tours.fr
Lamjed DebbichiLPCT | Physique et Chimie Théoriques - Université de LorraineDirección de correo verificada de kaist.ac.kr
André AndersLeibniz Institute of Surface Engineering (IOM)Dirección de correo verificada de lbl.gov
David PechCNRS Researcher (LAAS)Dirección de correo verificada de laas.fr

Jean-François PIERSON

Full Professor - Institut Jean Lamour - Université de Lorraine (F)

Dirección de correo verificada de univ-lorraine.fr

Copper oxide Transition metal nitrides Magnetron sputtering Thin Films


Título	Citado por	Año
Vibrational properties of CuO and Cu4O3 from first-principles calculations, and Raman and infrared spectroscopy L Debbichi, MC Marco de Lucas, JF Pierson, P Kruger The Journal of Physical Chemistry C 116 (18), 10232-10237, 2012	235	2012
Cuprite, paramelaconite and tenorite films deposited by reactive magnetron sputtering JF Pierson, A Thobor-Keck, A Billard Applied surface science 210 (3-4), 359-367, 2003	230	2003
Reactive magnetron sputtering of copper, silver, and gold JF Pierson, D Wiederkehr, A Billard Thin Solid Films 478 (1-2), 196-205, 2005	174	2005
Structure and properties of copper nitride films formed by reactive magnetron sputtering JF Pierson Vacuum 66 (1), 59-64, 2002	127	2002
Stability of reactively sputtered silver oxide films JF Pierson, C Rousselot Surface and Coatings Technology 200 (1-4), 276-279, 2005	101	2005
Reactively sputtered zirconium nitride coatings: structural, mechanical, optical and electrical characteristics D Pilloud, AS Dehlinger, JF Pierson, A Roman, L Pichon Surface and Coatings Technology 174, 338-344, 2003	87	2003
Structural, electrical, optical, and mechanical characterizations of decorative thin films P Carvalho, F Vaz, L Rebouta, L Cunha, CJ Tavares, C Moura, E Alves, ... Journal of applied physics 98 (2), 023715, 2005	84	2005
Structural changes in Zr–Si–N films vs. their silicon content D Pilloud, JF Pierson, AP Marques, A Cavaleiro Surface and Coatings Technology 180, 352-356, 2004	79	2004
Asymmetric electrochemical capacitor microdevice designed with vanadium nitride and nickel oxide thin film electrodes E Eustache, R Frappier, RL Porto, S Bouhtiyya, JF Pierson, T Brousse Electrochemistry Communications 28, 104-106, 2013	73	2013
Transmittance enhancement and optical band gap widening of Cu₂O thin films after air annealing Y Wang, P Miska, D Pilloud, D Horwat, F Mücklich, JF Pierson Journal of Applied Physics 115 (7), 073505, 2014	66	2014
Influence of the nanostructuration of PVD hard TiN-based films on the durability of coated steel P Steyer, A Mege, D Pech, C Mendibide, J Fontaine, JF Pierson, C Esnouf, ... Surface and Coatings Technology 202 (11), 2268-2277, 2008	61	2008
Influence of silicon addition on the oxidation resistance of CrN coatings A Thobor-Keck, F Lapostolle, AS Dehlinger, D Pilloud, JF Pierson, ... Surface and Coatings Technology 200 (1-4), 264-268, 2005	60	2005
VN thin films as electrode materials for electrochemical capacitors R Lucio-Porto, S Bouhtiyya, JF Pierson, A Morel, F Capon, P Boulet, ... Electrochimica Acta 141, 203-211, 2014	59	2014
Electronic structures of , and CuO: A joint experimental and theoretical study Y Wang, S Lany, J Ghanbaja, Y Fagot-Revurat, YP Chen, F Soldera, ... Physical Review B 94 (24), 245418, 2016	54	2016
Application of sputtered ruthenium nitride thin films as electrode material for energy-storage devices S Bouhtiyya, RL Porto, B Laïk, P Boulet, F Capon, JP Pereira-Ramos, ... Scripta Materialia 68 (9), 659-662, 2013	51	2013
Addition of silver in copper nitride films deposited by reactive magnetron sputtering JF Pierson, D Horwat Scripta Materialia 58 (7), 568-570, 2008	51	2008
Influence of substrate temperature on titanium oxynitride thin films prepared by reactive sputtering JM Chappé, N Martin, JF Pierson, G Terwagne, J Lintymer, J Gavoille, ... Applied Surface Science 225 (1-4), 29-38, 2004	50	2004
Oxidation resistance improvement of arc-evaporated TiN hard coatings by silicon addition P Steyer, D Pilloud, JF Pierson, JP Millet, M Charnay, B Stauder, ... Surface and Coatings Technology 201 (7), 4158-4162, 2006	48	2006
Investigation of Niobium oxynitride thin films deposited by reactive magnetron sputtering M Fenker, H Kappl, O Banakh, N Martin, JF Pierson Surface and Coatings Technology 201 (7), 4152-4157, 2006	43	2006
Property change in multifunctional TiCxOy thin films: Effect of the O/Ti ratio AC Fernandes, P Carvalho, F Vaz, S Lanceros-Méndez, AV Machado, ... Thin Solid Films 515 (3), 866-871, 2006	42	2006

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