Yun-Rae Jo
Yun-Rae Jo
Dirección de correo verificada de samsung.com
TítuloCitado porAño
A 1.92-megapixel CMOS image sensor with column-parallel low-power and area-efficient SA-ADCs
MS Shin, JB Kim, MK Kim, YR Jo, OK Kwon
IEEE Transactions on Electron Devices 59 (6), 1693-1700, 2012
572012
CMOS X-ray detector with column-parallel 14.3-bit extended-counting ADCs
MS Shin, JB Kim, YR Jo, MK Kim, BC Kwak, HC Seol, OK Kwon
IEEE Transactions on Electron Devices 60 (3), 1169-1177, 2013
232013
A Low-Noise and Area-Efficient PWM-ADC Using a Single-Slope Quantizer for CMOS Image Sensors
YR Jo, SK Hong, OK Kwon
IEEE Transactions on Electron Devices 63 (1), 168-173, 2015
112015
A multi-bit incremental ADC based on successive approximation for low noise and high resolution column-parallel readout circuits
YR Jo, SK Hong, OK Kwon
IEEE Transactions on Circuits and Systems I: Regular Papers 62 (9), 2156-2166, 2015
52015
A tileable CMOS X-ray line detector using time-delay-integration with pseudomultisampling for large-sized dental X-ray imaging systems
YR Jo, SK Hong, OK Kwon
IEEE Transactions on Electron Devices 64 (1), 211-216, 2016
42016
CMOS flat-panel X-ray detector with dual-gain active pixel sensors and column-parallel readout circuits
YR Jo, SK Hong, OK Kwon
IEEE Transactions on Nuclear Science 61 (5), 2472-2479, 2014
32014
A ΔΣ-cyclic hybrid ADC for parallel readout sensor applications
MK Kim, MS Shin, YR Jo, JB Kim, J Gou, S Yoo, OK Kwon
2012 IEEE International Symposium on Circuits and Systems, 532-535, 2012
12012
Driving Method for Compensating Reliability Problem of Hydrogenated Amorphous Silicon Thin Film Transistors and Image Sticking Phenomenon in Active Matrix Organic Light …
MS Shin, YR Jo, OK Kwon
Japanese Journal of Applied Physics 50 (3S), 03CC01, 2011
12011
Driving Method for Compensating Instability of a-Si: H TFT and OLED Degradation in AMOLED Displays
MS Shin, YR Jo, OK Kwon
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