Advances in atomic force microscopy FJ Giessibl
Reviews of modern physics 75 (3), 949, 2003
2250 2003 Atomic resolution of the silicon (111)-(7x7) surface by atomic force microscopy FJ Giessibl
Science 267 (5194), 68-71, 1995
1366 1995 Noncontact atomic force microscopy S Morita, FJ Giessibl, E Meyer, R Wiesendanger
Springer, 2015
892 2015 Forces and frequency shifts in atomic-resolution dynamic-force microscopy FJ Giessibl
Physical Review B 56 (24), 16010, 1997
797 1997 High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork FJ Giessibl
Applied Physics Letters 73 (26), 3956-3958, 1998
560 1998 Atomic resolution on FJ Giessibl
Applied Physics Letters 76 (11), 1470-1472, 2000
553 2000 Subatomic features on the silicon (111)-(7× 7) surface observed by atomic force microscopy FJ Giessibl, S Hembacher, H Bielefeldt, J Mannhart
Science 289 (5478), 422-425, 2000
463 2000 The force needed to move an atom on a surface M Ternes, CP Lutz, CF Hirjibehedin, FJ Giessibl, AJ Heinrich
Science 319 (5866), 1066-1069, 2008
432 2008 A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy FJ Gießibl
Applied Physics Letters 78 (1), 123-125, 2001
304 2001 Measuring the charge state of an adatom with noncontact atomic force microscopy L Gross, F Mohn, P Liljeroth, J Repp, FJ Giessibl, G Meyer
Science 324 (5933), 1428-1431, 2009
299 2009 Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy FJ Giessibl, H Bielefeldt, S Hembacher, J Mannhart
Applied Surface Science 140 (3-4), 352-357, 1999
207 1999 Revealing the hidden atom in graphite by low-temperature atomic force microscopy S Hembacher, FJ Giessibl, J Mannhart, CF Quate
Proceedings of the National Academy of Sciences 100 (22), 12539-12542, 2003
186 2003 Force microscopy with light-atom probes S Hembacher, FJ Giessibl, J Mannhart
Science 305 (5682), 380-383, 2004
177 2004 Physical interpretation of frequency-modulation atomic force microscopy FJ Giessibl, H Bielefeldt
Physical Review B 61 (15), 9968, 2000
169 2000 AFM's path to atomic resolution FJ Giessibl
Materials Today 8 (5), 32-41, 2005
132 2005 Revealing the angular symmetry of chemical bonds by atomic force microscopy J Welker, FJ Giessibl
Science 336 (6080), 444-449, 2012
125 2012 Local spectroscopy and atomic imaging of tunneling current, forces, and dissipation on graphite S Hembacher, FJ Giessibl, J Mannhart, CF Quate
Physical review letters 94 (5), 056101, 2005
119 2005 Piezoresistive cantilevers utilized for scanning tunneling and scanning force microscope in ultrahigh vacuum FJ Giessibl, BM Trafas
Review of scientific instruments 65 (6), 1923-1929, 1994
119 1994 Interplay of conductance, force, and structural change in metallic point contacts M Ternes, C González, CP Lutz, P Hapala, FJ Giessibl, P Jelínek, ...
Physical review letters 106 (1), 016802, 2011
118 2011 Friction traced to the single atom FJ Giessibl, M Herz, J Mannhart
Proceedings of the National Academy of Sciences 99 (19), 12006-12010, 2002
113 2002 