| Fast MTF measurement of CMOS imagers using ISO 12333 slanted-edge methodology M Estribeau, P Magnan Optical Systems Design, 243-252, 2004 | 109 | 2004 |
| Radiation effects in pinned photodiode CMOS image sensors: Pixel performance degradation due to total ionizing dose V Goiffon, M Estribeau, O Marcelot, P Cervantes, P Magnan, M Gaillardin, ... Nuclear Science, IEEE Transactions on 59 (6), 2878-2887, 2012 | 62 | 2012 |
| Identification of radiation induced dark current sources in pinned photodiode CMOS image sensors V Goiffon, C Virmontois, P Magnan, P Cervantes, S Place, M Gaillardin, ... Nuclear Science, IEEE Transactions on 59 (4), 918-926, 2012 | 40 | 2012 |
| Overview of ionizing radiation effects in image sensors fabricated in a deep-submicrometer CMOS imaging technology V Goiffon, M Estribeau, P Magnan Electron Devices, IEEE Transactions on 56 (11), 2594-2601, 2009 | 40 | 2009 |
| X-Ray and Particle Image Sensors-Overview of Ionizing Radiation Effects in Image Sensors Fabricated in a Deep-Submicrometer CMOS Imaging Technology V Goiffon, M Estribeau, P Magnan IEEE Transactions on Electron Devices 56 (11), 2594, 2009 | 40* | 2009 |
| Theoretical models of modulation transfer function, quantum efficiency, and crosstalk for CCD and CMOS image sensors I Djite, M Estribeau, P Magnan, G Rolland, S Petit, O Saint-Pe Electron Devices, IEEE Transactions on 59 (3), 729-737, 2012 | 39 | 2012 |
| Pixel level characterization of pinned photodiode and transfer gate physical parameters in CMOS image sensors V Goiffon, M Estribeau, J Michelot, P Cervantes, A Pelamatti, O Marcelot, ... IEEE Journal of the Electron Devices Society 2 (4), 65-76, 2014 | 34 | 2014 |
| Estimation and modeling of the full well capacity in pinned photodiode CMOS image sensors A Pelamatti, V Goiffon, M Estribeau, P Cervantes, P Magnan IEEE Electron Device Letters 34 (7), 900-902, 2013 | 34 | 2013 |
| Influence of transfer gate design and bias on the radiation hardness of pinned photodiode CMOS image sensors V Goiffon, M Estribeau, P Cervantes, R Molina, M Gaillardin, P Magnan IEEE Transactions on Nuclear Science 61 (6), 3290-3301, 2014 | 29 | 2014 |
| Radiation damages in CMOS image sensors: testing and hardening challenges brought by deep sub-micrometer CIS processes V Goiffon, C Virmontois, P Magnan, P Cervantes, F Corbiere, M Estribeau, ... Remote Sensing, 78261S-78261S-12, 2010 | 26 | 2010 |
| Generic radiation hardened photodiode layouts for deep submicron CMOS image sensor processes V Goiffon, P Cervantes, C Virmontois, F Corbière, P Magnan, M Estribeau Nuclear Science, IEEE Transactions on 58 (6), 3076-3084, 2011 | 22 | 2011 |
| Theoretical evaluation of MTF and charge collection efficiency in CCD and CMOS image sensors I Djité, P Magnan, M Estribeau, G Rolland, S Petit, O Saint-Pé SPIE Optical Engineering+ Applications, 742705-742705-12, 2009 | 20 | 2009 |
| Fast MTF measurement of CMOS imagers at the chip level using ISO 12233 slanted-edge methodology M Estribeau, P Magnan Proceedings of SPIE 5570, 557-567, 2004 | 20 | 2004 |
| Pixel crosstalk and correlation with modulation transfer function of CMOS image sensor M Estribeau, P Magnan Electronic Imaging 2005, 98-108, 2005 | 16 | 2005 |
| Radiation effects in CMOS isolation oxides: Differences and similarities with thermal oxides M Gaillardin, V Goiffon, C Marcandella, S Girard, M Martinez, P Paillet, ... IEEE, 2013 | 14 | 2013 |
| Study of CCD Transport on CMOS Imaging Technology: Comparison Between SCCD and BCCD, and Ramp Effect on the CTI O Marcelot, M Estribeau, V Goiffon, P Martin-Gonthier, F Corbiere, ... IEEE Transactions on Electron Devices 61, 844-849, 2014 | 13 | 2014 |
| ISAE, Université de Toulouse, Toulouse F-31055, France. O Marcelot, M Estribeau, V Goiffon, P Martin-Gonthier, F Corbire, R Molina, ... IEEE, 2014 | 13* | 2014 |
| Temperature dependence and dynamic behavior of full well capacity in pinned photodiode CMOS image sensors A Pelamatti, JM Belloir, C Messien, V Goiffon, M Estribeau, P Magnan, ... IEEE Transactions on Electron Devices 62 (4), 1200-1207, 2015 | 12 | 2015 |
| Vulnerability of CMOS image sensors in megajoule class laser harsh environment V Goiffon, S Girard, A Chabane, P Paillet, P Magnan, P Cervantes, ... Optics express 20 (18), 20028-20042, 2012 | 10 | 2012 |
| Dynamic range optimisation of CMOS image sensors dedicated to space applications P Martin-Gonthier, P Magnan, F Corbière, M Estribeau, N Huger, ... Remote Sensing, 67440U-67440U-11, 2007 | 9 | 2007 |
