Title / AuthorYear
J Long, E Shelhamer, T Darrell
Proceedings of the IEEE conference on computer vision and pattern …
2015
LC Chen, G Papandreou, I Kokkinos, K Murphy, AL Yuille
IEEE transactions on pattern analysis and machine intelligence 40 (4), 834-848
2017
V Badrinarayanan, A Kendall, R Cipolla
IEEE transactions on pattern analysis and machine intelligence 39 (12), 2481 …
2017
F Yu, V Koltun
arXiv preprint arXiv:1511.07122
2015
J Johnson, A Alahi, L Fei-Fei
European conference on computer vision, 694-711
2016
H Zhao, J Shi, X Qi, X Wang, J Jia
Proceedings of the IEEE conference on computer vision and pattern …
2017
A Newell, K Yang, J Deng
European conference on computer vision, 483-499
2016
F Milletari, N Navab, SA Ahmadi
2016 Fourth International Conference on 3D Vision (3DV), 565-571
2016
H Nam, B Han
Proceedings of the IEEE conference on computer vision and pattern …
2016
K Kamnitsas, C Ledig, VFJ Newcombe, JP Simpson, AD Kane, DK Menon, ...
Medical image analysis 36, 61-78
2017
LC Chen, G Papandreou, F Schroff, H Adam
arXiv preprint arXiv:1706.05587
2017
G Lin, A Milan, C Shen, I Reid
Proceedings of the IEEE conference on computer vision and pattern …
2017
G Lin, C Shen, A Van Den Hengel, I Reid
Proceedings of the IEEE conference on computer vision and pattern …
2016
Y Guo, Y Liu, A Oerlemans, S Lao, S Wu, MS Lew
Neurocomputing 187, 27-48
2016
J Gu, Z Wang, J Kuen, L Ma, A Shahroudy, B Shuai, T Liu, X Wang, ...
Pattern Recognition 77, 354-377
2018
LC Chen, Y Zhu, G Papandreou, F Schroff, H Adam
Proceedings of the European conference on computer vision (ECCV), 801-818
2018
G Ros, L Sellart, J Materzynska, D Vazquez, AM Lopez
Proceedings of the IEEE conference on computer vision and pattern …
2016
LC Chen, Y Yang, J Wang, W Xu, AL Yuille
Proceedings of the IEEE conference on computer vision and pattern …
2016
PO Pinheiro, TY Lin, R Collobert, P Dollár
European Conference on Computer Vision, 75-91
2016
A Paszke, A Chaurasia, S Kim, E Culurciello
arXiv preprint arXiv:1606.02147
2016
1 - 20
Dates and citation counts are estimated and are determined automatically by a computer program.